tag:blogger.com,1999:blog-4273139713770751485.post1699234592424352921..comments2024-03-29T11:45:43.197+05:30Comments on Musings of Dheeraj Sanghi: Stress due to multiple entrance exams: A Proposed SolutionDheeraj Sanghihttp://www.blogger.com/profile/06367519409840642182noreply@blogger.comBlogger1125tag:blogger.com,1999:blog-4273139713770751485.post-11747182902570232652011-04-28T19:21:05.857+05:302011-04-28T19:21:05.857+05:30I find it , if I may, *befuddling* that we can'...I find it , if I may, *befuddling* that we can't have a common aptitude and technological test (one which could be given on multiple days) on the same lines on GRE and Subject GRE. Also, score reporting methods could be introduced on similar lines. I believe this wold reduce much burden on students and the universities in conducting such examinations and post processing applications.decorrhttps://www.blogger.com/profile/18042392419594433063noreply@blogger.com